Copper Mountain Epsilometer for Dielectric Materials Measurement

min Quantity
1 piece
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base price
Item available at short notice. Delivery Time ~7-14 workdays
Item available at short notice. Delivery Time ~7-14 workdays
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Benefits of the Copper Mountain Epsilometer 3 MHz to 6 GHz for Material Testing

  • Developed in collaboration with Compass Technology.
  • Applications in measurements of antenna radomes, microwave circuit materials, 5G, Bluetooth, Wifi, etc.
  • Broad frequency range from 3 MHz to 6 GHz and can accommodate sheet specimens from 0.3 to 3 mm thick.

Epsilometer for Dielectric Materials Measurement

The Copper Mountain Technologies Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications. The Epsilometer is used for measuring the dielectric properties of materials. It measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick. The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.

The Epsilometer solution includes an R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.

  • Frequency range 3 MHz to 6 GHz
  • Impedance 50 Ω.
  • Sheet thickness 0.3 to 3 mm
  • The database is populated up to a permittivity of 25.
  • Suitable for testing ceramics (sample surface must be flat).