HIOKI 350x Series C Meters/Testers
Description
Files/Downloads
Benefits of the 3504 and 3506 Capacitance Testing Instruments
- Instruments for low capacitance or large capacitance MLCC testing.
- Measurement frequencies of 1 kHz/1 MHz or 120 Hz/1 kHz.
- Ideal for testing taping machines and sorters.
HIOKI 350x Series C Meters/Testers
The HIOKI 350x series are a family of capacitance testers. While the C meter 3506-10 is an instrument for low capacitance testing, the testers 3504-60/-50/-40 are large capacitance MLCC (multi layer ceramic capacitor) testers. A variety of features help to improve capacitor testing, such as analog measurement times as low as 0.6 ms (or 1.5 ms FAST, 1 MHz, 3506-10), comparator, BIN (classification of C measurement values), memory, contact-checking function and trigger-synchronous output.
- C meter HIOKI 3506-10:
- Instrument for low capacitance testing with measurement frequencies of 1 kHz and 1 MHz.
- High-speed measurement with an analog measurement time of 0.6 ms (1 MHz).
- Improved noise resistance and dramatically increased repeatability for measurement of minuscule capacitance values.
- Stable measurement of low-capacitance capacitors at 1 MHz.
- C testers HIOKI 3504-60/3504-50/3504-40:
- Instrument for large capacitance MLCC testing with measurement frequencies of 120 Hz and 1 kHz.
- Constant-voltage measurement with an analog measurement time of 1 ms (1 kHz); ideal for measurement of high-capacitance MLCCs.
- Constant-voltage measurement of high capacitance values up to 1.45 mF (120 Hz, 500 mV).
- Model 3504-60 provides four-terminal contact checking.
Model Overview
| Model | 3504-40 | 3504-50 | 3504-60 | 3506-10 |
| Type | C testers/large capacitance MLCC testing | C meter/low capacitance testing | ||
| Measured parameters | C (capacitance), D (dissipation factor tan δ) | C (capacitance), D (dissipation factor tan δ), Q (1/tan δ) | ||
| Measurement frequencies | 120 Hz, 1 kHz | 1 kHz, 1 MHz | ||
| Range of measurable values | C: 0.9400 pF...20.0000 mF; D: 0.00001...1.99999 | C: 0.000 fF...15.0000 µF; D: 0.00001...1.99999; Q: 0.0...19999.9 | ||
| Measurement time | Nominal 2 ms (1 kHz, FAST; the measurement time differs depending on the measurement frequency and measurement speed that are set) | Representative value: 1.5 ms (FAST; actual measurement time depends on measurement configuration settings) | ||
| Measurement speed | FAST/NORMAL/SLOW | FAST/NORMAL/SLOW | ||
| Four-terminal contact-checking function | - | - | Detects contact anomalies (open state in four-terminal measurements) | - |
| BIN measurement | - | C: 14 ranks, D-NG, OUT OF BINS, absolute value setting, Δ% setting | C: 13 ranks, D-NG, OUT OF BINS, absolute value setting, Δ setting, Δ% setting | |
| Display | LED | |||
| Interfaces | RS232C, EXT I/O | RS232C, GPIB, EXT I/O | RS232C, GPIB and EXT I/O | |
| Printer function: Measurement values can be printed (requires optional printer 9442 and optional connection cable 9444) | ||||
| Memory function | Up to 32,000 measurement values can be stored in the instrument (downloadable by RS232C or GPIB) | Up to 1,000 measurement values can be stored in the instrument (downloadable by RS232C or GPIB) | ||
| Dimensions (mm) approx. | 260 x 100 x 220; 3.8 kg | 260 x 100 x 298; 4.8 kg | ||
Included: 3506 or 3504 (one of the veariants), power cord, spare fuse
