HIOKI ST5680 DC HiPot Tester

HIOKI ST5680 DC hipot tester
min Quantity
1 piece
Unit price
base price
Item available at short notice. Delivery Time ~10-25 workdays
Item available at short notice. Delivery Time ~10-25 workdays
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Benefits of the ST5680 battery safety and insulation tester

  • Verify battery safety and insulation performance using waveforms.
  • High-spec model for DC withstand voltage testing.
  • Features arc detection and contact check functions to prevent shipment of defective batteries.

HIOKI ST5680 DC HiPot Tester

The HIOKI ST5680 is a DC hipot tester. The device tests for reliable insulation with a waveform by applying a high voltage to the DUT (device/object under test). The ST5680 applies a DC voltage between test locations and measures leakage current to determine insulation performance.

  • DC hipot tester improves battery quality with waveform analysis.
  • Boost the inspection performance of safety testing.
  • Prevents the shipment of batteries with latent defects that could lead to fires.
  • Verify insulation performance with waveforms and values to improve production processes, analyze defective batteries, and to promote inspection quality.
  • Prevent minuscule failures due to arc discharges.
  • Preventing testing do-overs due to erroneous judgements.
  • Satisfies test conditions defined by international standards.
  • Insulation breakdown voltage (BDV) measurement function.
  • Leakage current resolution 0.001 µA.
  • Trend data for traceability.
  • Also for safety testing according to IEC617302 on photovoltaic modules.

Model Overview

ModelST5680
Main functionsDC hipot test, insulation resistance test, breakdown voltage test, waveform display functionality, arc discharge detection, contact check function
Various tests and functionalities
▸DC hipot test
  • Output voltage: DC 0.010...8.000 kV (1 V resolution).
  • Output setting accuracy: ±(1.2% of setting +20 V).
  • Output current/cutoff current: Max. 20 mA.
  • Current accuracy: >3.00 mA: ±(1.5% rdg. +2 μA); ≤3.00 mA: ±1.5% rdg.
  • Maximum resolution: 0.001 μA.
  • Test time: 0.1...999 s, continuous (timer off).
  • Voltage ramp up/ramp down time: 0.1...300 s/0.1...300 s, off.
  • Short-circuit current: 200 mA or less.
  • Test modes: W to IR, IR to W, program test.
Insulation resistance test
  • Output voltage: 10 VDC...2000 V (1 V resolution).
  • Output setting accuracy: ±(1.2% of setting +2 V).
  • Resistance value display range: 10.00 kΩ...200.0 GΩ (0.01 kΩ resolution).
  • Accuracy guarantee range: 10.00 kΩ...99.99 GΩ.
  • Resistance accuracy: ±(1.5% rdg. + 3 dgt.).
  • Test time: 0.1...999 s, continuous (timer off).
  • Voltage rise/fall time: 0.1...300 s/0.1...300 s, off.
Breakdown voltage test
  • Test method: Continuous voltage rise test, stepped voltage rise test.
  • Measurement: Insulation breakdown voltage (kV), insulation breakdown strength (kV/mm).
  • Settings: Start voltage, end voltage, rise speed, arc detection, electrode distance, upper limit current.
Waveform display functionality
  • Waveform display: Voltage, current, insulation resistance.
  • Sampling rate: 500 kS/s.
  • Resolution: 256 Kwords.
Arc discharge detection
  • Detection method: Monitoring of fluctuations in the test voltage.
  • Settings: Test voltage variability 1% to 50%.
Contact check functionality
  • Detection method: Capacitance measurement method.
  • Settings: Threshold (capacitance) setting 1.0...100.0 nF.
Memory functionality
  • Saving of waveforms/graphs: Save to USB memory. Save formats: BMP, PNG, CSV.
  • Panel memory function: Saves test condition settings internally in the instrument. DC withstand voltage testing/insulation resistance testing: Up to 64 sets of settings each. Program testing: Up to 30 programs (max. 50 steps). Insulation breakdown voltage testing: Up to 10 sets of settings.
  • Data memory function: Saves measured values in the instrument’s internal memory (up to 32,000 values).
Judgement functionality (judgement output)
  • PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL).
  • UPPER_FAIL: Measured value > upper limit value.
  • PASS: Upper limit value ≥ measured value ≥ lower limit value.
  • LOWER_FAIL: Measured value < lower limit value.
List of other featuresInterlock, auto discharge, offset cancellation, set voltage modification during testing, Momentary out, command monitor, I/O handler test, key lock, self-check, calibration deadline check, EXT SW (remote control)
EnvironmentalOperating temperature 0...+40°C; 80% rel. humidity or less (non-condensing)
StandardsSafety: IEC 61010; EMC: IEC 61326 class A
Power supply100...240 VAC; power consumption approx. 180 VA; power supply conditions are 220 V power supply voltage, 50/60 Hz power supply frequency, DC withstand voltage test mode, 2.5 kV test voltage, and 5 mA load current (500 kΩ load resistance)
Maximum rated power800 VA
InterfaceCommunication: USB, LAN/Ethernet, EXT I/O; options: RS232C (Z3001), GPIB (Z3000); memory: USB drive
Dimensions (mm)305 x 142 x 430 (excluding protruding parts), approx. 10 kg

Included: ST 5680, power cord, CD (PDF instruction manual, PDF communication instruction manual), EXT I/O male connector, EXT I/O connector cover, custom-made interlock-canceling connector for the EXT I/O, startup guide.

Datasheet_HIOKI_ST5680_en.pdf